JIMMIE
ANDREW MILLER, PhD
139 Spring Oak Drive, Salisbury, NC 28147
(704) 855-3747 jamiller@uncc.edu personal.uncc.edu/jamiller
EDUCATION:
PhD Engineering (Precision Engineering),
University of Warwick, Coventry, England, July 1994.
MSE Engineering (Microelectronics),
University of North Carolina at Charlotte, Dec 1987.
BS Physics,
University
of North Carolina at Charlotte, May 1985.
BS Mathematics,
University of North Carolina at Charlotte, May 1985.
AAS Electronics Engineering Technology,
Rowan-Cabarrus Community College, Sep 1980.
TECHNICAL INTERESTS
AND EXPERTISE:
Machine Tool
Metrology
Dimensional
Metrology
High Speed Data
Acquisition and Processing
Electronic Control Interfacing
Microelectronic Electrical Parametrical
Testing
EMPLOYMENT
HISTORY:
Chief Engineer: Center for Precision
Metrology @ UNC Charlotte
Mar
1993 - Present
Responsibilities
involve graduate student research consultation and design review, industrial
project development, limited supervision of electronics and mechanical
technicians, equipment training and repair, equipment budgeting and procurement
specification, and general managerial oversight of various precision
engineering focus laboratories such as metrology and computer integrated
manufacturing. Laboratory renovation and expansion coordinator.
STM Nanomemory Project, UNC
Charlotte
Aug
1989 - Dec 1992
Investigating
the feasibility of producing a new type of memory with storage density 104
- 106 times greater than current technology. The project involved
using scanning tunneling microscopy techniques to modify surfaces at the
nanometer level. Other STM research included examining the wear pattern on
cutting tools, process dependence of plasma enhanced chemical vapor deposition
of germanium on silicon and diamond on silicon.
Research Organizational Assistant,
UNC Charlotte
Jan
1989 - Aug 1989
Assisted
Dr. Robert Hocken (Distinguished Professor) in the logistics involved in
establishing the UNC Charlotte Precision Engineering Laboratory. Duties included
technical diagramming for funded research, and writing specifications and
contacting suppliers of research equipment, and other support functions.
Microelectronics Research, UNC Charlotte
Sep 1986 - May 1988
Clean room fabrication of metal-oxide-silicon capacitors;
parametrical testing using capacitance vs. voltage, conductance, and
charge-capacitance techniques; obtaining doping profiles, and interface trap
and oxide charge densities; bias temperature aging and hot carrier injection
into oxides; data acquisition and computer programming.
Physics Laboratory Instructor,
UNC Charlotte
Aug 1983 - May 1985
Teaching
and grading an undergraduate middle level physics mechanics laboratory at UNCC.
Electronics Tester and
Troubleshooter, Western Electric
Oct 1980 - Aug 1981
Structured
testing of telephone trunk line system components with board level
troubleshooting.
TECHNICAL JOURNAL
PUBLICATIONS:
Miller, Jimmie. A., Hocken, Robert, Smith, Stuart T., and
Harb, Salaam, "X-ray calibrated tunneling system utilizing a dimensionally
stable nanometer positioner", Precision Engineering, 18(2/3),
pp. 99-102 (1996).
Varhue, W. J., Carulli, J. M., Peterson, G. G., and
Miller, J. A., "Low temperature epitaxial growth of Ge using
electron-cyclotron-resonance plasma-assisted chemical vapor deposition",
J. Appl. Phys. 71(4), 1949, 1992.
Varhue, J., Carulli, J. M., Miller, J. A., and Peterson,
G. G., "Surface morphology of epitaxial Ge on Si grown by plasma enhanced
chemical vapor deposition", J. Vac. Sci. Tech. B 9(4) 2202 (1991).
Miller, Jimmie A. and Hocken, Robert J. "Scanning
tunneling microscopy bit making on highly oriented pyrolytic graphite: initial
results", J. Appl. Phys. 68(2),
905 (1990).
Miller, Jimmie A., Blat, Catherine, and Nicollian, Edward
H.,"Accurate measurement of trivalent silicon interface trap density using
small signal steady state methods",
J. Appl. Phys. 66(2), 716
(1989).
CONFERENCE PROCEEDINGS
Feng , Qibo; Hocken, Robert J.; Miller, Jimmie A.; “Quick
and dynamic measurements of geometric errors of CNC machines”, in Process Control and Inspection for Industry Proceedings
of SPIE vol 4222 (2000) pp 110-113.
Miller, Jimmie A.; Hocken, Robert; Feng, Qibo; and
Ramanan, Vignesh; “Foundation for Dynamic Metrology of Machine Tools”
Proceedings of the ASPE 1999 Annual Meeting, Oct 31- Nov 4, 1999, in Monterey
California.
Salsbury James; Hocken, Robert; Miller, Jimmie; and Raja,
Jay; “Graduate Level Education in Metrology”, Proceedings of the 1999 NCSL Workshop and Symposium, July
1999, pp 351-362.
Hocken, R., and Miller, J. A., “Nanotechnology in
metrology”, Proceedings of the Fifth International Symposium on Robotics and
Manufacturing, August 14-18, 1994 in Maui, Hawaii.
Hocken, R. et al., “Research in engineering metrology…”
Proceedings of NSF Design and Manufacturing Conferences, 1993 and 1994.
Miller, J. A., Smith., S.T., “Tunneling current
characterization: An application of an X-ray interferometric calibrated stage,”
Proceedings of the ASPE 1993Annual
Meeting, Nov 1993, pp. 37-40.
Hocken, Robert J., and Miller,. Jimmie A., “
Nanotechnology and its impact on manufacturing”, Japan/USA Symposium on
Flexible Automation ASME 1992, p 7ff.
Lavigne, C., Miller, J. A., and Hocken., R. J. , “A long
range STM/AFM” Proceedings of the ASPE 1991 Annual Conference, Santa Fe, NM,
Oct 1991.
Miller, J. A., Hocken, R., “Scanning tunneling microscopy
bit-making for use in high density memory chip applications,” Proceedings of
the ASPE 1990 Annual Conference, Nov
1990, pp. 119-120.
PATENT:
US# 6,434,845 “Dual-axis static and dynamic force
characterization device.” Pereira; Paulo H. (Peoria, IL); Muralidhar; Ashok (Minneapolis,
MN); Hocken; Robert J. (Concord, NC); Miller; Jimmie A. (Salisbury, NC); Smith;
Stuart (Charlotte, NC). Licensed.
PhD THESIS:
"From
STM to Nanomemory: A Transfer of Technology Feasibility Study".
University
of Warwick, Coventry, England,
Engineering Dept., 1994.
MASTERS THESIS:
"Negative bias temperature instability in wet and
dry oxides".
University
of North Carolina Charlotte, Engineering Science Dept., 1987.
SOCIETY MEMBERSHIP
Member
of the American Society for Precision Engineering (ASPE).
HONORS AND AWARDS:
Microelectronics
Center of N. C. Fellowship,
Phi Kappa
Phi National Honor Society,
Sigma Pi
Sigma National Physics Honor Society,
Pi Mu
Epsilon National Math Honor Society,
Aphrodite
K. Anderson Mathematics Award,
Lynn
Hauser Pierce Mathematics Scholarship,
Art
Creativity Award.
COMMUNITY INVOLVEMENT:
Served in various offices of Grace Bible Church,
Rockwell, NC. Offices included trustee, finance committee member, Sunday school
superintendent, and youth leader.
